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Next Midi MINATEC by GIANT
26 May @ 12h30 - 14h00
Your next scientific conference will be held on English, don’t miss it! 🙂
“Atomic Force Microscopy for electrical characterization”
Given by: Lukasz Borowik, HDR, Expert de Direction, CEA-Leti
The Atomic Force Microscopy is a method where various parameters can be measured locally with nanometric resolution. Especially, electrical investigation is possible when using some atomic force microscopy specific modes. During this presentation I will go through different examples of atomic force microscopy electrical characterization applied on materials (e.g. silicon, gallium nitride, two dimensional GaSe) and devices (e.g. photodetectors, transistors, LEDs).
Date : Friday 26 may 2023 at 12h30